Introduction
The advanced remote sensing instrument of the new generation ---- Imaging Spectrometer combines the spectrometer technology with the traditional two- dimensional imaging remote sensing technology to form a three-dimensional instrument for remote sensing. While detecting the spatial characteristics of the target with imaging technology, imaging spectrometer disperses each spatial pixel into several tens, or even several hundreds of spectral channels of 10nm bandwidth with spectral technology. The features of ground target can ten be determined through analysis of the spectral characteristic from the image data. It is the great advantage of the high spectral resolution of imaging spectrometer that remote sensing technology initiates completely new application prospects in geo-science.

China has large territory and rich natural resources. The remote sensing technology is bound to play an important role in the country. SITP works on remote sensing instruments for more than 20 years and has developed a series of practical airborne imaging spectrometers. Supports by government high technology plan (863 plan), an advanced airborne earth observation system will be developed in the end of 2000. The system will be equipped with high spectral resolution imaging spectrometer, high spatial resolution camera, 3-dimension imaging and advanced SAR and will be used to resource and environment investigation, remote sensing. Operative Modular airborne Imaging Spectrometer (OMIS) and Wide -view CCD Pushbroom Hyperspectral Imagery (WPHI) consist of the high spectral resolution optical sensors. OMIS and WPHI now are developing in Shanghai Institute of Technical Physics and Shanghai Xiantong Institute of Information Technology.

2 Operative Modular Airborne Imaging Spectrometer (OMIS)

2.1 System Design of OMIS
OMIS is a new generation optical mechanical scanning imaging spectrometer which developing in SITP and SXIIT. The design of OMIS system is based on the linear array detector addition to optical mechanical scanner. The system includes scanning unit, imaging optical unit, spectrometer units, data collection and record unit, monitoring unit, gyrostabilizer platform, GPS and ground system. The specification of OMIS is listed in table 1. Figure 1 is the stereoscopic drawing of OMIS. The characteristics of OMIS are as follows:

The number of bands in OMIS is 128. There are 64 bands in visible/near infrared region, 8 bands in short-wave infrared I region, 32 bands in short-wave infrared II region, 8 bands in middle infrared region and 8 bands in thermal infrared. Five spectrometers are designed to cover total spectral wavelength from 0.45 to 12 mn, They are visible/near infrared spectrometer, short-wave infrared I spectrometer, short-wave infrared II spectrometer, middle infrared spectrometer, thermal infrared spectrometer. The total field of view of OMIS is larger than 70°. OMIS has two operating modes. There are 128 bands and 3mrad IFOV in high Spectral Mode. A Mode B is high spatial resolution mode. The number of bands in mode B is 50 and the IFOV of mode B is as high as 1.5 mrad. The scanning unit, imaging unit and spectrometers are designed as special modules. Different specification of the system can be arranged by combing different modules. A special gyrostabilizer platform is designed in OMIS's system to adapt low high level flying aircraft and to improve the quality of image. The stability of the system is better than half pixel. A high quality difference GPS system is used in OMIS system. Positioning accuracy is better than 10 meter. Based on the radiation and spectral calibration in laboratory and onboard, the system can support the calibration data.

MODEL A			MODEL B
Band:	128		Band:	64
(0.4-1.1mm)	64		(0.4-1.1mm)	60
(1.1-2.0mm)	16		(1.55-1.75mm)	1
(3-5 mm)	32		2.08-2.35mm)	1
(8-12 mm)	8		(8-12mm)	1
Spectral Interval:	10 nm	(V/NIR)	Spectral Interval:	10 nm	(V/NIR)
	50 nm	(SWIR1)		200 nm	(SWIRI)
	15 nm	(SWIR2)		270 nm	(SWIR2)
	250 nm	(MIR)		2000 nm	(SWIR2)
	500 nm	(TIR)		4000 nm	(MIR)
IFOV:	3 mrad		IFOV:	1.5 -3 mrad	(TIR)
TFOV:	78 degree		TFOV:	78 degree
Scan Rate:	10-20 lines/sec		Scan Rate:	10-20 lines/sec
Optical Aperture	200 mm		Optical Aperture	200mm
Pixel per Line:	512		Pixel per Line:	512
Data Encode :	12 bit		Data Encode:	12 bit
Data rate:	5.12 Mbps		Data rate:	5.12 Mbps
Detector:	64-Element Si	(V/NIR)	Detector:	64-Element Si	(V/NIR)
	8-Element InGasAs	(SWIRI)		1-Element InGaAs	(SWIR)
	32-Element InSb	(SWIR2)		InSb & MCT 2- Colour	(MIR & TIR)
	8-Element InSb	(MIR)
	8-Element MCT	(TIR)
NEDr	0.2%-0.5%		NEDr	0.2 % -0.5%
NEDT	0.2-1.OK		NEDT	0.2K

Table 1: The main technical specification of OMIS



Fig. 1 The Stereoscopic Drawing of OMIS