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Characterising variability in crop yield series
Markand Oza
CMD/ARG/RESA,
Space Applications Centre (ISRO),
Ahmedabad - 380 015
It may be of considerable interest to order the
crop yield series in terms of inherent variability. This is useful before taking up a study
so that an attempt may be made for a more stable crop before graduating to attempt analysis
of more complex phenomena. For the present study, All-India yield series of wheat, rice,
sugarcane, oilseeds and cotton crops from 1949-50 to 1997-98 were considered. Fractal
dimension was used as a measure of complexity. This measure is used to rank the complexity
of the series.
It has been observed that wheat yield series have the lowest fractal dimensionality and
oilseeds have the highest. This should imply that, comparatively, it is easier to model
wheat yield compared to cotton yield.
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