Characterising variability in crop yield series
Markand Oza CMD/ARG/RESA, Space Applications Centre (ISRO), Ahmedabad - 380 015 It may be of considerable interest to order the crop yield series in terms of inherent variability. This is useful before taking up a study so that an attempt may be made for a more stable crop before graduating to attempt analysis of more complex phenomena. For the present study, All-India yield series of wheat, rice, sugarcane, oilseeds and cotton crops from 1949-50 to 1997-98 were considered. Fractal dimension was used as a measure of complexity. This measure is used to rank the complexity of the series. It has been observed that wheat yield series have the lowest fractal dimensionality and oilseeds have the highest. This should imply that, comparatively, it is easier to model wheat yield compared to cotton yield. | ||
| © GISdevelopment.net. All rights reserved. |